By analyzing the lifetime prediction analytical models of IGBT reliability researches at home and abroad in recent years, the IGBT lifetime prediction model based on junction temperature and the IGBT lifetime prediction model based on multivariate were proposed. The Conffin-Manson model, the Lesit model, the Norris-Landzberg model and the Bayerer model were analyzed. The advantages and disadvantages of corresponding models and their building methods were summarized. And then the development trend and direction of analytical models were pointed out.