随机振动载荷下板级焊点失效模式分析
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(空军工程大学 航空航天工程学院, 西安 710038 )

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李剑峰(1993-),男(汉族),安徽芜湖人,硕士,研究方向为航空航天系统测试自动化与故障诊断。 ·电路与系统设计·随机振动载荷下板级焊点失效模式分析 李剑峰, 肖明清, 董佳岩, 盛增津, 陈垚君 (空军工程大学 航空航天工程学院, 西安 710038 )摘 要: 通过搭建振动加速失效实验平台,完成了芯片中板级焊点的失效实验。在此基础上,对焊点进行电镜观察分析,以确定焊点在振动载荷下的失效模式。结果表明,内部焊点基本没有裂纹扩展迹象,裂纹集中于最外侧角的焊点,焊点的损伤程度分布从内至外呈递增趋势。裂纹的分布集中于PCB板侧和芯片侧的IMC层区域,即在焊点两侧的钎料疏松部位,并沿着IMC层区域的Cu6Sn5晶粒方向进行穿晶、沿晶扩展。裂纹的扩展接近于贯穿时,易发生瞬间脆性断裂。 关键词: 随机振动;加速度功率谱;BGA焊点;裂纹;失效模式 中图分类号:TN406 文献标识码:A

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TN406

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Failure Mode Analysis of Board-Level Solder Joint with Random Vibration Load
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(Aeronautics and Astronautics Engineering College, Air Force Engineering University, Xi’an 710038, P. R. China)

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    摘要:

    通过搭建振动加速失效实验平台,完成了芯片中板级焊点的失效实验。在此基础上,对焊点进行电镜观察分析,以确定焊点在振动载荷下的失效模式。结果表明,内部焊点基本没有裂纹扩展迹象,裂纹集中于最外侧角的焊点,焊点的损伤程度分布从内至外呈递增趋势。裂纹的分布集中于PCB板侧和芯片侧的IMC层区域,即在焊点两侧的钎料疏松部位,并沿着IMC层区域的Cu6Sn5晶粒方向进行穿晶、沿晶扩展。裂纹的扩展接近于贯穿时,易发生瞬间脆性断裂。

    Abstract:

    Having set up the vibration acceleration failure test platform, the failure test of solder joints was completed. On this basis, solder joints were observed by electron microscope, and failure modes under vibration load were studied. The results showed that the solder joint on the outermost corner of the chip was a key part and the cracks degree distribution of solder joints had a tendency of increase from inside to outside. There was almost no cracks extension indication in internal solder joints, and the cracks were concentrated in the outermost corners of the solder joints. Cracks were distributed in the PCB board side and the chip side of the IMC (intermetallic compound) layer area, where the chip side withstanded greater stress. The crack was easily sprouted on the loose parts of the solder joint and extended along the Cu6Sn5 grain in the IMC layer. There were two kinds of extension modes:transgranular and intergranular. When the crack extension tended to the penetration, the crack was prone to momentary brittle fracture.

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  • 收稿日期:2017-11-08
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  • 在线发布日期: 2018-12-12
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